Daniel Sawyer is a Group Leader in the Semiconductor and Dimensional Metrology Divisions at the National Institute of Standards and Technology (NIST). He has worked for over 20 years in the area of performance evaluation of the coordinate measuring systems and was a member of the ASME B89.4.19 project team, which authored the first American standard for performance testing of laser trackers. He has a Bachelor of Science Degrees in business administration and mechanical engineering from Towson State University and the University of Maryland, respectively and a Masters in mechanical engineering from the Johns Hopkins University in Baltimore, Maryland.
